AZoNano

Atomic Force Microscopy: A Step-by-Step Guide with Specialist Steven Marsden

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...
Nature

Atomic Force Microscopy and Infrared Spectroscopy Techniques

Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...
Nature

Atomic Force Microscopy and Its Applications in Biological Systems

Atomic force microscopy (AFM) has emerged as a pivotal technique in biological research, offering unparalleled spatial resolution and force sensitivity to visualise and quantify the nanoscale ...
technologynetworks

Scanning Probe Microscopy – Including Scanning Tunneling Microscopy and Atomic Force Microscopy – Principles and Applications

What is scanning tunneling microscopy? STM uses a nanoscale probe to measure the topography and local electronic properties of a sample by scanning the probe over a surface. As the tip is scanned over ...
AZoNano

Conversations on AFM: How AI is Automating Scanning Probe Microscopy

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...
Physics World

Seeing atoms by brute force: 30 years of atomic force microscopy

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...
New Electronics

Atomic force microscopy set to answer fundamental questions in a range of fields

The microscope is one of science's oldest tools for examining nature, going back at least to the late 16th Century, with Galileo being its most famous pioneer – he called it the 'little eye'. For ...
University of Sheffield

Surface Characterisation at the Most Fundamental Level: Atomic Force Microscopy comes to the Henry Royce Institute in Sheffield

The very first Nano-Electrochemical Atomic Force Microscope in Europe is now up and running at the Henry Royce Institute in Sheffield. At the cutting edge of scanning probe microscope (SPM) technology ...
The Pioneer

IIT Delhi, global team automates atomic force microscopy using AI

Researchers at IIT Delhi, with collaborators from Denmark and Germany, have developed AILA, an AI agent capable of ...
Electronics Weekly

Entry-level Atomic Force Microscopes

Hitachi High-Tech Corp has launched its AFM100 and AFM100 Plus systems – entry-level and intermediate-level models of Hitachi’s Atomic Force Microscopes (AFM). These tools are designed to offer ease ...
pv magazine International

New research sheds light on defect regions in perovskite solar films

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...
PR Newswire

Park Systems Announces Park FX40, the Autonomous AFM with Built-in Intelligence - A Groundbreaking New Class of Atomic Force Microscope

SANTA CLARA, Calif., June 25, 2021 /PRNewswire/ -- Park Systems, the fastest growing manufacturer of Atomic Force Microscopes (AFM) just announced Park FX40, a groundbreaking autonomous atomic force ...