A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

The ability to create and choose the most effective test patterns has become more daunting as more patterns are introduced, says Ron Press of Siemens Digital Industries. Choosing the most efficient ...

Intel this week revealed defect density metrics for its 18A (1.8nm-class) process technology and said that it was healthy at the Deutsche Bank's 2024 Technology Conference. The company also said that ...

executivebrief.com – Learn how you can solidify your process improvement strategy by collecting vital data at each quality checkpoint. Study these best practices for implementing a program that will ...