Through Cadence's support of the ARM MBIST interface, customers can deliver innovative SoC designs to market faster and with better power, performance and area (PPA). For example, the Modus Test ...
“Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM) is one of the most promising candidates to replace conventional embedded memory such as Static RAM and Dynamic RAM. However, due to the ...
SAN JOSE, Calif., Nov. 14, 2016 – Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced that the Cadence ® Modus ™ Test Solution now supports the Arm ® Memory Built-In Self Test (MBIST) ...
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