A design approach based on reuse of intellectual property may be essential for efficient design creation and verification, but what is the impact for test? Teresa McLaurin, Design Center Consultant, ...
To succeed in the competitive electronics marketplace, semiconductor companies need silicon that is ready on schedule and with sufficient quality for the target application. Typical devices are ...
Path delay fault models test for delays along a predetermined path caused by resistive-capacitive coupling with other paths. None of these failures will reveal themselves through purely static ...
Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS) and Analog Devices, Inc. (ADI), a global semiconductor leader, have collaborated to create a comprehensive test solution ...
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