P20 spring probe contact connectors maintain a positive force against a mating surface. With very low mating forces connection is rapid, effortless and user-friendly, and significant mating ...

If you've ever tenuously probed an expensive IC in a surface-mount package, you'll appreciate these new test adjuncts from Emulation Technology (ET—Santa Clara, Calif.). It's rolling out test clips ...

Exploiting a proven spring-probe design, the QUAD-4 test clip ensures secure, non-evasive contact for Micron TSOPII packaged ICs. It is designed to clip over surface-mounted DDR SDRAM memories in the ...

Fontana, CA. Everett Charles Technologies (ECT) announced it has won a head-to-head evaluation using ZIP Z0-040 probes made with HyperCore material in a high-volume production environment at a large ...

Bristol, PA. March 10 – Aries Electronics, a U.S. manufacturer of standard, programmed, and custom interconnection products, burn-in and test sockets used worldwide, today introduced, at the BiTS ...

Smiths Interconnect has launched its Kepler contact technology for IC Testing. Kepler claims to be the only solution that provides two-axis of motion during a single actuation of the socket, an ...