Each new manufacturing process generation brings with it a whole new set of challenges. In an era of multimillion-gate complexity and increasing density of nanometer manufacturing defects, a key ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Testing can represent as much as half the cost of semiconductor device manufacture. To reduce that, Mentor Graphics' TestKompress uses a new compression technology that lets designers cut the amount ...

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.

General Electric will find out later this summer how the core of the new engine for the 777X performs in an isolated ground test. The maturation testing on the high pressure compressor rig will ...

This video demonstrates the compression test performed on a milk crate using Instron universal testing machine. Compression testing was performed to measure the strength of the milk crate. Instron ...

Steep inter compressor ducts (ICDs) are a promising solution for reducing the environmental impact of future aircraft engines through lower fuel consumption. This fuel saving is due to several factors ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...