The ability to create and choose the most effective test patterns has become more daunting as more patterns are introduced, says Ron Press of Siemens Digital Industries. Choosing the most efficient ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Power consumption is one of the key considerations when designing today’s semiconductor chips and systems. Over the years, the constant need for higher performance and more functions from the chips ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

This paper is presented with the Video Graphics Array (VGA) and Digital Visual Interface - Digital (DVI-D) test pattern generator solution with display monitor timing specification as per the Video ...