STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
The µHELIX® line of durable, fine-pitch probes is designed to test electrical targets with ±15-micron pointing accuracy on 10-mil center-to-center placement. Probe diameter sizes are 20, 16, 12, and 8 ...
New family of PhazorRFâ high frequency probe cards, breaking industry frequency and performance benchmarks targeting next generation automotive radar, 5G and 6G platforms. PhazorRF's ultra-low loss, ...
STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...
Sometimes the simplest ideas at the best, and this surface-mount test probe pint from French form Nicomatic is certainly simple. Called the C12000 series, they are intended to present a mechanical ...
GL Communications has announced its latest stand-alone and automated voice, video and data testing probe referred to as VQuad Probe HD (High-Definition). Robert Bichefsky, a senior manager for product ...
Why are test points a crucial element in developing a successful circuit? Types of test points available, and the different techniques that employ them. Electronic design has always been an endeavor ...
HSINCHU, March 18, 2025 /PRNewswire/ -- STAr Technologies, a leading probe card manufacturer, has been engaged in probe card technology for 25 years and is at the cutting edge of probe card ...
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