The contemporary fast-moving high-tech environment brings a strong urgency to efficient management of defects within software in relation to maintaining software quality and integrity. With every ...
Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...
Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Machine learning models are highly influenced by the data they are trained on in terms of their performance, ...
Researchers have developed a new method for detecting defects in additively manufactured components. Researchers at the University of Illinois Urbana-Champaign have developed a new method for ...
Tokyo, Japan – Scientists from Tokyo Metropolitan University have used machine learning to automate the identification of defects in sister chromatid cohesion. They trained a convolutional neural ...
Longitudinal (top) and axial (middle) images of X-Ray CT data of parts with 6 internal defects: a spherical clog, a stellated shaped clog, a cone shaped void, a blob shaped void, an elliptical warp of ...
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